Publication Date
2012
Document Type
Thesis
Committee Members
Robert Fitch, Jr. (Committee Member), Douglas Petkie (Committee Member), Yan Zhuang (Advisor), Yan Zhuang (Committee Member)
Degree Name
Master of Science in Engineering (MSEgr)
Abstract
There are two words that describe the direction of today's electronic technology, smaller and faster. With the ever decreeing size scientists and engineers must have a way to characterize materials in the nm range. In this thesis characterization of nano-materials is discussed based on scanning probe microscopy and an in-depth look at RF/microwave frequencies by scanning microwave microscopy. Recently, low-temperature spin-sprayed ferrite films (Fe3O4) with a high self-biased magnetic anisotropy field have been reported, showing FMR frequency>5 GHz. Such films hold great potential for RF/microwave devices and find immediate applications. In this study, we performed in situ scanning microwave microscopy (SMM) characterization at frequencies between 2.0 GHz and 8.0 GHz. The grain boundary appeared to be more conductive, which might be caused by charge accumulation in the grain boundary space-charge region.
Page Count
108
Department or Program
Department of Electrical Engineering
Year Degree Awarded
2012
Copyright
Copyright 2012, all rights reserved. This open access ETD is published by Wright State University and OhioLINK.
