Automated, High Resistivity Hall Effect and Photoelectronic Apparatus

Authors

David C. Look, Wright State University - Main CampusFollow
J. W. Farmer

Document Type

Article

Publication Date

4-1-1981

Abstract

Describes a computer-controlled system capable of measuring a wide range of semiconductor resistivities and Hall coefficients, as well as their dependences upon temperature (4.2-600K), magnetic field (0-1.8 T), and monochromatic light irradiation (up to 2*10¹⁸ photons cm^-2 s^-1, held constant over the range 0.76-2.5 mu m). With the use of a guarded cable configuration, the response time for a 10¹³ Omega sample is less than 10 s. The system uses commercial components whenever possible and is built around a PDP 11-03 computer with a standard IEEE-488 I/O bus. The only important noncommercial piece of apparatus used is a wavelength scan and intensity control system for a popular, ¹/₄ m, high intensity monochromator.

Repository Citation

Look, D. C., & Farmer, J. W. (1981). Automated, High Resistivity Hall Effect and Photoelectronic Apparatus. Journal of Physics E: Scientific Instruments, 14 (4), 472-477.
https://corescholar.libraries.wright.edu/physics/634

DOI

10.1088/0022-3735/14/4/020