Terahertz Apertureless Near-Field Microscopy of a Vanadium Dioxide Thin Film

Authors

Hui Zhan
Michael Hvasta
Victoria Astley
Jason A. Deibel, Wright State University - Main CampusFollow
Daniel M. Mittleman

Document Type

Conference Proceeding

Publication Date

5-2007

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Abstract

We report the application of terahertz apertureless near-field microscopy to vanadium dioxide thin films. We observe an enhancement of the terahertz amplitude due to the metal-insulator transition induced by an applied voltage.

Comments

Presented at the Conference on Lasers and Electro-Optics, Baltimore, MD, May 6-11, 2007.

Repository Citation

Zhan, H., Hvasta, M., Astley, V., Deibel, J. A., & Mittleman, D. M. (2007). Terahertz Apertureless Near-Field Microscopy of a Vanadium Dioxide Thin Film. Conference on Lasers and Electro-Optics, 1-2.
https://corescholar.libraries.wright.edu/physics/866

DOI

10.1109/CLEO.2007.4453028