Non-Contact, Antenna-Free Probe for Characterization of Thz Devices and Components
Document Type
Conference Proceeding
Publication Date
7-2-2016
Abstract
This paper presents fabrication and testing of a contact-free, antenna-free probe for characterizing planar semiconducting devices in the THz region.
Repository Citation
Mingardi, A.,
Zhang, W.,
& Brown, E.
(2016). Non-Contact, Antenna-Free Probe for Characterization of Thz Devices and Components. Proceedings of the IEEE National Aerospace Electronics Conference, NAECON, 441-444.
https://corescholar.libraries.wright.edu/physics/1098
DOI
10.1109/NAECON.2016.7856845
