The Flux, Temperature, and Energy-Dependence of Dissociation Pinning in Electron-Irradiated Gold

Document Type

Article

Publication Date

1-1-1989

Identifier/URL

41027611 (Pure)

Abstract

Modulus and damping measurements were made on high-purity, polycrystalline gold during electron irradiations over the temperature range 310-390 K. For the flux- and temperature-dependence studies 1.75 MeV electrons were used, while the energy dependence was studied over the range 0.6-2.2 MeV. An analysis of the dislocation pinning rates showed a nonlinear flux dependence (to the power 0.86). The difference in migration energies of gold interstitials in the lattice and the dislocation line was 0.07 eV. The variation of pinning rate with energy was used to determine an experimental probability-of-displacement function.

DOI

10.1088/0953-8984/1/28/006

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