DeSalvo, G. C.,
Look, D. C.,
Bozada, C. A.,
& Ebel, J. L.
(1997). Depth Measurement of Doped Semiconductors Using the Hall Technique. Journal of Applied Physics, 81 (1), 281-284.
Copyright © 1997, American Institute of Physics. This article may be downloaded for personal use only. Any other use requires prior permission of the author and the American Institute of Physics. The following article appeared in the Journal of Applied Physics 81.1, and may be found at http://jap.aip.org/resource/1/japiau/v81/i1/p281_s1