Identification of Electron-Irradiation Defects in Semi-Insulating GaAs by Normalized Thermally Stimulated Current Measurements

Authors

David C. Look, Wright State University - Main CampusFollow
Z-Q. FangFollow
Joseph W. Hemsky, Wright State University - Main CampusFollow
P. Kengkan

Document Type

Article

Publication Date

1-1-1997

Comments

The original publication is available at http://prb.aps.org/abstract/PRB/v55/i4/p2214_1

Repository Citation

Look, D. C., Fang, Z., Hemsky, J. W., & Kengkan, P. (1997). Identification of Electron-Irradiation Defects in Semi-Insulating GaAs by Normalized Thermally Stimulated Current Measurements. Physical Review B, 55 (4), 2214-2218.
https://corescholar.libraries.wright.edu/physics/201

DOI

10.1103/PhysRevB.55.2214