A thermally stimulated current peak, occurring at 100 K for a heating rate of 0.4 K/s, has been found in semi‐insulating GaN grown by molecular beam epitaxy. This peak has contributions from two traps, with the main trap described by the following parameters: emission thermal activation energy E≂90±2 meV, effective capture cross‐section σ≂3±1×10−22 cm−2, and Nμτ≂3±1 × 1014 cm−1 V −1, where N is the trap concentration, μ the mobility, and τ the free‐carrier lifetime. This trap is much deeper than the typical shallow donors in conducting GaN, but shallower than any of the centers reported in recent deep level transient spectroscopy measurements.
Look, D. C.,
& Morkoç, H.
(1996). Thermally Stimulated Current Trap in GaN. Applied Physics Letters, 68 (26), 3775-3777.