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We measured high spatial/depth resolution 300 K thermal conductivity κ of the Zn and O surfaces of two bulk n-type ZnO (0001) samples, grown by a vapor-phase transport method, using scanning thermal microscopy (SThM). The thermal investigation was performed in both point-by-point (∼2 μm resolution) and area-scan modes. On the first sample κ=1.16±0.08 (Zn face)/1.10±0.09 (O face) W/cm K while for the second material κ=1.02±0.07 (Zn face)/0.98±0.08 (O face) W/cm K. These are the highest κ values reported on ZnO. A correlation between SThM area-scan readings and surface topography was established by simultaneously performing atomic force microscopy scans. The influence of surface roughness on the effective thermal conductivity (i.e., heat flow) is discussed. © 2002 American Institute of Physics.


Copyright © 2002, American Institute of Physics. This article may be downloaded for personal use only. Any other use requires prior permission of the author and the American Institute of Physics. The following article appeared in the Journal of Applied Physics 91.2, and may be found at



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