Local Grain Orientation and Strain in Polycrystalline YBa₂Cu₃O_7−δ Superconductor Thin Films Measured by Raman Spectroscopy

Authors

Maher S. Amer, Wright State University - Main CampusFollow
John F. Maguire
L. Cai
Rand R. Biggers
Steven Leclair

Document Type

Article

Publication Date

2001

Abstract

We report direct measurements of local grain orientation and residual strain in polycrystalline,C-axis oriented thin YBa₂Cu₃O_7−δ superconducting films using polarized Raman spectroscopy. Strain dependence of the A_g Raman active mode at 335 cm−1 was calibrated and used to measure local strain in the films. Our data showed that high quality films are associated with the connected path of uniform grain orientation (single crystal-like) across the film and uniform residual strain in the range of −0.3%. Nonuniform grain orientation or high angle grain boundaries and nonuniform local strains were associated with low quality films.

Repository Citation

Amer, M. S., Maguire, J. F., Cai, L., Biggers, R. R., & Leclair, S. (2001). Local Grain Orientation and Strain in Polycrystalline YBa₂Cu₃O_7−δ Superconductor Thin Films Measured by Raman Spectroscopy. Journal of Applied Physics, 89 (12), 8030-8034.
https://corescholar.libraries.wright.edu/mme/292

DOI

10.1063/1.1371946