Local Grain Orientation and Strain in Polycrystalline YBa2Cu3O7−δ Superconductor Thin Films Measured by Raman Spectroscopy
We report direct measurements of local grain orientation and residual strain in polycrystalline,C-axis oriented thin YBa2Cu3O7−δ superconducting films using polarized Raman spectroscopy. Strain dependence of the Ag Raman active mode at 335 cm−1 was calibrated and used to measure local strain in the films. Our data showed that high quality films are associated with the connected path of uniform grain orientation (single crystal-like) across the film and uniform residual strain in the range of −0.3%. Nonuniform grain orientation or high angle grain boundaries and nonuniform local strains were associated with low quality films.
Amer, M. S.,
Maguire, J. F.,
Biggers, R. R.,
& Leclair, S.
(2001). Local Grain Orientation and Strain in Polycrystalline YBa2Cu3O7−δ Superconductor Thin Films Measured by Raman Spectroscopy. Journal of Applied Physics, 89 (12), 8030-8034.