Non-Contact Probes for Characterization of THz Devices and Components

Authors

J. R. Middendorf, Wright State University
J. S. Cetnar, Wright State University
Elliott R. Brown, Wright State University - Main CampusFollow

Document Type

Article

Publication Date

11-13-2014

Identifier/URL

40256331 (Pure); 84911951960 (QABO)

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Abstract

We investigate through numerical simulation the coupling properties of a novel, AC-coupled, contact-free probe. The new probe couples radiation from a CPW-embedded device-under-test via polarization current, which is then transformed to conduction current in the probe and down-converted in frequency to baseband by an optically-pumped photomixer. Numerous simulations have been realized in order to understand and improve the behavior of the probe. Here, we present the most interesting results: the use of a symmetric side coupled coplanar waveguide and a broadband design showing promising performance up to 1300 GHz with an operating range of 1 THz.

Repository Citation

Middendorf, J. R., Cetnar, J. S., & Brown, E. R. (2014). Non-Contact Probes for Characterization of THz Devices and Components. 2014 39th International Conference on Infrared, Millimeter, and Terahertz waves (IRMMW-THz).
https://corescholar.libraries.wright.edu/physics/1196

DOI

10.1109/IRMMW-THz.2014.6956286