Optical Transmittance and Reflectance of Lanthanum Nickelate at Telecommunication Frequencies

Authors

Todd Schumann, University of Florida
Jacob Neff, University of Florida
Shayla Breedlove, University of Florida
Henry Zmuda, University of Florida
Yong Kyu Yoon, University of Florida
David C. Look, Wright State University - Main CampusFollow
Kevin Leedy, Wright-Patterson Air Force
Monica Allen, Wright-Patterson Air Force
Jeffery Allen, Wright-Patterson Air Force

Document Type

Article

Publication Date

10-24-2018

Identifier/URL

41052498 (Pure)

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Catalog Record

Abstract

The optical properties of lanthanum nickelate (LNO) films grown by chemical solution decomposition on sapphire substrates were measured and extracted. The relatively low imaginary part of the dielectric function indicates that LNO may perform well in plasmonic applications at traditional telecommunication frequencies.

Comments

Presented in the 2018 IEEE Research and Applications of Photonics In Defense Conference, August 22-24, 2018 Miramar Beach, Florida.

Repository Citation

Schumann, T., Neff, J., Breedlove, S., Zmuda, H., Yoon, Y. K., Look, D. C., Leedy, K., Allen, M., & Allen, J. (2018). Optical Transmittance and Reflectance of Lanthanum Nickelate at Telecommunication Frequencies. 2018 IEEE Research and Applications of Photonics In Defense Conference, 193-195.
https://corescholar.libraries.wright.edu/physics/1481

DOI

10.1109/RAPID.2018.8508962