Model-Free Determination of Optical Constants
Document Type
Article
Publication Date
3-2-2017
Identifier/URL
41002076 (Pure)
Abstract
For single slabs of uniform material, such as bulk semiconductors, we derive closed-form expressions for absorption and reflection coefficients, ∝ and R, respectively, in terms of measured reflectance and transmittance, Rm and Tm. The formula for α can replace the several commonly used approximations for ∝ as a function of Tm, and in particular does not require ∝d >> 1, where d is the thickness. Thus, it can be applied to weak impurity absorptions, such as Fe absorption in Fe-doped GaN. Finally, the real (η) and imaginary (κ) parts of the index of refraction (n = η + iκ) can be obtained from ∝ and R and agree well with η and κ results obtained from other experiments. For multi-layer structures, "effective" values of ∝, R, η, and κ are obtained, but they can often be assigned to a particular layer. This new technique has been successfully applied to many bulk and layered structures.
Repository Citation
Look, D. C.,
Leedy, K. D.,
Kiefer, A.,
Claflin, B.,
Itagaki, N.,
Matsushima, K.,
& Suhariadi, I.
(2017). Model-Free Determination of Optical Constants. Oxide-Based Materials and Devices VIII 2017, 10105.
https://corescholar.libraries.wright.edu/physics/1498
DOI
10.1117/12.2255769
