Characterization of Local Dielectric Properties of Superconductor YBa 2Cu 3O 7-δ Using Evanescent Microwave Microscopy
Document Type
Article
Publication Date
6-1-2005
Abstract
A near-field evanescent microwave microscope based on a coaxial transmission line resonator with a tungsten tip protruding through an end-wall aperture is used to measure local dielectric properties of thin film YBa/sub 2/Cu/sub 3/O/sub 7-/spl delta// in superconducting state below critical temperature T/sub c/=91 K at T=79.4 K and in normal state at room temperature (T=298 K). The dielectric property of the superconductor within the near field of the tip frustrates the electric field and measurably changes the transmission line's resonant frequency. The shift of the resonator's frequency is measured as a function of tip-sample separation and associated change in quality factor (Q) image scans of the thin film is obtained. A quantitative relationship between the real and imaginary parts of the local dielectric constant and the frequency shift using the method of images is established. The comparison between experimental data and theory based on this method is given and discussed for YBa/sub 2/Cu/sub 3/O/sub 7-/spl delta// thin film deposited on LaAlO/sub 3/ substrate.
Repository Citation
Kleismit, R. A.,
Kozlowski, G.,
Biggers, R.,
Maartense, I.,
Kazimierczuk, M. K.,
& Mast, D. B.
(2005). Characterization of Local Dielectric Properties of Superconductor YBa 2Cu 3O 7-δ Using Evanescent Microwave Microscopy. IEEE Transactions on Applied Superconductivity, 15 (2 PART III), 2915-2918.
https://corescholar.libraries.wright.edu/physics/1566
DOI
10.1109/TASC.2005.848633
