Document Type
Article
Publication Date
3-1-1999
Abstract
High-energy electron irradiation in ZnO produces shallow donors at about EC-30meV. Because the production rate is much higher for Zn-face (0001) than O-face (0001̅ ) irradiation, the donor is identified as a Zn-sublattice defect, most likely the interstitial ZnI or a ZnI-related complex. The donor energy is quite close to that of the unirradiated sample, and of other samples discussed in the literature, strongly suggesting that ZnI (and not VO) is the dominant native shallow donor in ZnO. An exceptionally high displacement threshold energy (∼1.6MeV) is quantitatively explained in terms of a multiple-displacement model.
Repository Citation
Look, D. C.,
Hemsky, J. W.,
& Sizelove, J. R.
(1999). Residual Native Shallow Donor in ZnO. Physical Review Letters, 82 (12), 2552-2555.
https://corescholar.libraries.wright.edu/physics/216
DOI
10.1103/PhysRevLett.82.2552
Comments
The original publication is available at http://prl.aps.org/abstract/PRL/v82/i12/p2552_1