Nanoscale Depth-Resolved Cathodoluminescence Spectroscopy of ZnO Surfaces and Metal Interfaces
Document Type
Article
Publication Date
2009
Abstract
The electronic properties of ZnO surfaces and interfaces has until recently been relatively unexplored. We have used a complement of ultrahigh vacuum scanning electron microscope (SEM)-based, depth-resolved cathodoluminescence spectroscopy (DRCLS), temperature-dependent charge transport, trap spectroscopy, and surface science techniques to probe the electronic and chemical properties of clean surfaces and interfaces on a nanometer scale. DRCLS reveals remarkable nanoscale correlations of native point defect distributions with surface and sub-surface defects calibrated with capacitance trap spectroscopies, atomic force microscopy, and Kelvin probe force microscopy. The measurement of these near-surface states associated with native point defects in the ZnO bulk and those induced by interface chemical bonding is a powerful extension of cathodoluminescence spectroscopy that provides a guide to understanding and controlling ZnO electronic contacts.
Repository Citation
Brillson, L. J.,
Mosbacker, H. L.,
Doutt, D. L.,
Dong, Y.,
Fang, Z.,
Look, D. C.,
Cantwell, G.,
Zhang, J.,
& Song, J. J.
(2009). Nanoscale Depth-Resolved Cathodoluminescence Spectroscopy of ZnO Surfaces and Metal Interfaces. Superlattices and Microstructures, 45 (4-5), 206-213.
https://corescholar.libraries.wright.edu/physics/229
DOI
10.1016/j.spmi.2008.11.008
