Characterization and Analysis of pHEMT Devices

Authors

David C. Look, Wright State University - Main CampusFollow

Document Type

Conference Proceeding

Publication Date

1996

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Catalog Record

Comments

Presented at the 1996 International Conference on Advanced Semiconductor Devices and Microsystems (ASDAM '96), Smolenice, Slovakia.

Repository Citation

Look, D. C. (1996). Characterization and Analysis of pHEMT Devices. Proceedings of the International Conference on Advanced Semiconductor Devices and Microsystems, 161.
https://corescholar.libraries.wright.edu/physics/684