Point Defect Characterization in III-V Semiconducting Compounds

Authors

David C. Look, Wright State University - Main CampusFollow

Document Type

Conference Proceeding

Publication Date

1991

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Catalog Record

Comments

Presented at the 38th Sagamore Army Materials Conference, Plymouth, MA.

Repository Citation

Look, D. C. (1991). Point Defect Characterization in III-V Semiconducting Compounds. Proceedings of the 38th Sagamore Army Materials Research Conference, 293.
https://corescholar.libraries.wright.edu/physics/757