Publication Date

2017

Document Type

Thesis

Committee Members

Michael Saville (Advisor), Amit Sharma (Committee Member), Vladimir Sotnikov (Committee Member)

Degree Name

Master of Science in Engineering (MSEgr)

Abstract

Diagnostics are necessary for measurement of plasma parameters such as electron, ion and atomic densities, electron temperature, plasma expansion velocity and spatial resolution of density gradients. These parameters play a critical role in defining how a plasma will interact with electromagnetic radiation. For example, the plasma black-out phenomenon occurs when electromagnetic waves are at frequencies below the plasma frequency, where plasma frequency is a function of electron density. Wave propagation diagnostics can improve understanding of a plasma when measurement supports parameter estimation. In this report, the dual-wavelength interferometry method provides a single diagnostic capability to measure plasma expansion velocity, atomic density and electron densities. Using a laboratory plasma created with wire-ablation pulsed-power techniques and the Sarkisov model, electron and atomic densities are estimated for copper and aluminum plasmas.

Page Count

62

Department or Program

Department of Electrical Engineering

Year Degree Awarded

2017


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