Development of an Automated Analyzer for TEM Diffraction Patterns

Authors

A. G. Jackson, Wright State University - Main CampusFollow
J. Park
D. Wood
S. R. LeClair

Document Type

Conference Proceeding

Publication Date

1-1-1993

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Catalog Record

Comments

Presented at the Fifty-First Annual Meeting of the Microscopy Society of America, Cincinnati, OH, August 1-6, 1993.

Repository Citation

Jackson, A. G., Park, J., Wood, D., & LeClair, S. R. (1993). Development of an Automated Analyzer for TEM Diffraction Patterns. Proceedings of the Annual Meeting of the Microscopy Society of America, 51, 264.
https://corescholar.libraries.wright.edu/mme/217