Raman Spectroscopy for Determining YBCO Thin Film Paramters In situ

Authors

David P. Lubbers
John D. Busbee
A. G. Jackson, Wright State University - Main CampusFollow
Rand R. Biggers

Document Type

Abstract

Publication Date

2-1-1997

Comments

Presented at the TMS Symposium on Advanced Sensors in Materials Processing, Orlando, FL, February 9-13, 1997.

Repository Citation

Lubbers, D. P., Busbee, J. D., Jackson, A. G., & Biggers, R. R. (1997). Raman Spectroscopy for Determining YBCO Thin Film Paramters In situ. .
https://corescholar.libraries.wright.edu/mme/242