Time-Resolved Photoluminescence Lifetime Measurements of the Gamma(5) and Gamma(6) Free Excitons in ZnO

Authors

D. C. ReynoldsFollow
David C. Look, Wright State University - Main CampusFollow
B. Jogai
J. E. Hoelscher
R. E. SherriffFollow
M. T. Harris
M. J. CallahanFollow

Document Type

Article

Publication Date

8-1-2000

Abstract

Time-resolved photoluminescence spectroscopy at 2 K was used to measure the radiative recombination lifetime of the allowed (Γ₅) and forbidden (Γ₆) free excitons in ZnO. The measurements were made on a sample containing internal strain, which altered the sample symmetry, and resulted in relaxed selection rules, allowing the Γ₆ exciton to be observed. A radiative recombination lifetime of 259 ps was measured for the Γ₅ exciton and 245 ps for the Γ₆ exciton. The decay of the free excitons was of single-exponential form, and the decay times were obtained using a least-squares fit of the data.

Comments

Copyright © 2000, American Institute of Physics. This article may be downloaded for personal use only. Any other use requires prior permission of the author and the American Institute of Physics. The following article appeared in the Journal of Applied Physics 88.4, and may be found at http://jap.aip.org/resource/1/japiau/v88/i4/p2152_s1

Repository Citation

Reynolds, D. C., Look, D. C., Jogai, B., Hoelscher, J. E., Sherriff, R. E., Harris, M. T., & Callahan, M. J. (2000). Time-Resolved Photoluminescence Lifetime Measurements of the Gamma(5) and Gamma(6) Free Excitons in ZnO. Journal of Applied Physics, 88 (4), 2152-2153.
https://corescholar.libraries.wright.edu/physics/143

DOI

10.1063/1.1305546