Resonant-Tunneling-Diode Loads: Speed Limits and Applications in Fast Logic Circuits
Document Type
Article
Publication Date
1-1-1992
Identifier/URL
40312938 (Pure); 33646912073 (QABO)
Abstract
It is shown that the high-speed and negative-resistance properties of the resonant tunneling diode (RTD) can improve the performance of some common inverters by greatly reducing the static power dissipation while affecting the dynamic properties to a much lesser extent. InGaAs RTDs with a peak-to-valley ratio of 12 at room temperature can switch in approximately 2 ps and, therefore, are useful as negative resistance loads for heterostructure transistors in digital circuits HFET-RTD and HBT-RTD inverter have been simulated using SPICE. The switching of the 1.0 mu m-gate-length HFT-RTD inverter is greater than that of the E-D HFET (heterostructure FET) inverter by over a factor of two, and static power is lower by a factor of five. A similar contrast is found between HBT-RTD and conventional HBT-I/sup 2/L (integrated injection logic) inverters.
Repository Citation
Brown, E. R.,
Hollis, M. A.,
Smith, F. W.,
Wang, K. C.,
& Asbeck, P. M.
(1992). Resonant-Tunneling-Diode Loads: Speed Limits and Applications in Fast Logic Circuits. Digest Technical Papers - 1992 39th IEEE International Solid-State Circuits Conference, ISSCC 1992, 142-143.
https://corescholar.libraries.wright.edu/physics/1433
DOI
10.1109/ISSCC.1992.200452
