Structural and Optical Properties of Indium-Doped Highly Conductive ZnO Bulk Crystals Grown by the Hydrothermal Technique
Document Type
Article
Publication Date
1-1-2018
Identifier/URL
41009514 (Pure)
Abstract
Indium-doped ZnO bulk crystals grown by the hydrothermal method are highly-conductive, with resistivity at 0.01 Ωcm at room temperature as revealed by Hall-effect measurement. In this paper we report on structural and optical properties of these crystals. The grown In: ZnO crystals have been studied by high resolution X-ray diffraction, micro-Raman scattering and low-temperature photoluminescence and cathodoluminescence. It was found that the c lattice parameter of the grown In: ZnO crystal expanded 0.06% with respect to the lithium-doped ZnO crystal seed, and the In-doped ZnO overgrew the seed crystal pseudomorphically but with high quality crystallinity; the X-ray rocking curves show the FWHM of the Zn face and O faces are only 0.05° and 0.1° ; and the indium concentration in the crystal reaches the solubility limit. Raman spectra show strain relaxation gradually from the regrowth interface as well as a weak spectral feature at 723 cm-1. The peak at 312 cm-1 noticed in hydrothermally grown In: ZnO nanostructures does not appear in our In-doped crystals, indicating that this peak may be associated with specific defects (e.g. surface related) of the nanostructures. Photoluminescence measurements show that an indium donor bound exciton peak I9 (In0X) is the dominant peak in the PL spectrum, located at 3.3586 eV on the zinc face and 3.3577 eV on the oxygen face. Both of them deviated from the consensus literature value of 3.3567 eV, probably due to strain in the crystal induced by impurities.
Repository Citation
Wang, B.,
Claflin, B.,
Look, D. C.,
& Jiménez, J.
(2018). Structural and Optical Properties of Indium-Doped Highly Conductive ZnO Bulk Crystals Grown by the Hydrothermal Technique. Oxide-Based Materials and Devices IX, 10533.
https://corescholar.libraries.wright.edu/physics/1490
DOI
10.1117/12.2289992

Comments
Presented at 2018 SPIE OPTO that took place from January 27 - February 1, 2018 in San Francisco, California.