Investigation of In Situ Raman Spectra for the Control of PLD of YBCO Thin Film Superconductors
Document Type
Article
Publication Date
10-1-2000
Abstract
To convert superconducting thin films from an interesting area of research to a viable industrial product such as long length coated-conductors, it is fast becoming apparent that some form of process control with feedback from the growing film is necessary during deposition and post-processing. Several different methodologies are being studied. Of these, one of the most promising is Raman spectroscopy (RS). However, the Raman effect is weak and is typically not well suited as a feedback sensor in the harsh environment of a deposition chamber. RS has been used primarily as an ex situ characterization technique. Two primary questions to be answered are how will the spectra taken during deposition and during post-deposition annealing differ from that of well characterized ex situ spectra. This paper attempts to find a preliminary answer to the second question. In this study, Raman spectra were taken during post oxygen annealing of films under a variety of conditions. The critical transition temperature (Tc) of films was obtained before and after annealing using AC susceptibility measurements. Results of these tests are used to demonstrate the feasibility of the Raman spectra and images as a feedback mechanism during deposition.
Repository Citation
Busbee, J.,
Biggers, R.,
Kozlowski, G.,
Maartense, I.,
Jones, J.,
& Dempsey, D.
(2000). Investigation of In Situ Raman Spectra for the Control of PLD of YBCO Thin Film Superconductors. Engineering Applications of Artificial Intelligence, 13 (5), 589-596.
https://corescholar.libraries.wright.edu/physics/1572
DOI
10.1016/S0952-1976(00)00038-5
