Schottky-Barrier Mobility Profiling Measurements With Gate-Current Corrections

Authors

David C. Look, Wright State University - Main CampusFollow
T. A. Cooper

Document Type

Article

Publication Date

5-1985

Repository Citation

Look, D. C., & Cooper, T. A. (1985). Schottky-Barrier Mobility Profiling Measurements With Gate-Current Corrections. Solid-State Electronics, 28 (5), 521-527.
https://corescholar.libraries.wright.edu/physics/363

DOI

10.1016/0038-1101(85)90117-0