We derive expressions for the depletion width and capacitance transient applicable to traps which may be deep and of high concentration. The new results are compared with those obtained from the commonly used formulas, and also from an exact analysis. Experimental deep level transient spectroscopic data for EL2 in GaAs are in good agreement.
Look, D. C.,
& Sizelove, J. R.
(1995). Depletion Width and Capacitance Transient formulas for Deep Traps of High-Concentration. Journal of Applied Physics, 78 (4), 2848-2850.